Product (RFP/RFQ/RFI/Solicitation/Tender/Bid Etc.) ID: ELEMI-1490

Government Authority located in Cleveland, Ohio; USA based organization looking for expert vendor for field emission scanning electron microscope system.

[*] Budget: Looking for Proposals

[*] Scope of Service:

Vendor needs to provide field emission scanning electron microscope system to the government authority located in Cleveland, OH.
- An analytical, high resolution, thermal Schottky type field emission scanning electron microscope (FE-SEM)
- Both high and Field Emission modes of operation for organic and inorganic sample evaluation, with integrated ESD (Energy-dispersive X-ray spectroscopy), particle analysis,
- The FE-SEM will be used to evaluate polymer, metal and ceramic materials. Current SEM in area is at end of life, additionally it is not capable of accepting samples of critical test size that need to remain uncut for follow-on testing. An FE-SEM will allow for high resolution imaging of samples for high-cycle fatigue and reaction zones in high temperature testing and materials development in our research area
- Large eucentric sample stage
- Stage size 200mm, with 8kg weight capability in XYZRT
- 6kg weight capability in XYZR.
- Travel: X: 125mm, Y: 100mm, Z: 80mm, R: 360o, Tilt = -10o to 90o
- Movement options to include both keyboard/mouse control and joystick
- Stage large enough to image samples weighing up to 8kg without destruction of samples.
- Stage shall accommodate samples up to 100mm in height, and 200mm (or greater) in diameter without the need to remove any stage spacer or rotation module and provide all 5 axis movement
- Must be capable of mounting of samples up to 160mm in height (with smaller diameters) via alternative mounting methods to the stage – i.e. side mount options,
- Sample Navigation System – high resolution color camera internal to chamber for sample navigation. Color image must link to SEM images and EDS data for map of analysis locations with store and recall of position and analysis conditions.
- In-Chamber IR Camera – sample, stage, chamber and detector observation and navigation.
- Additional Ports on chamber for capability to add additional detectors in the future
- High Speed Pumping System – Less than 5 minute Sample Exchange Time.

[*] Eligibility:

- Onshore (USA Organization Only);

[*] Work Performance:

Performance of the work will be Offsite. Vendor needs to carry work in their office location.

Expiry Date : Friday, 11 June, 2021

Category : Electron Microscope

Country : USA

State : Ohio

RFP Expired

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